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Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescenceSokolov, V. I., Pustovarov, V. A., Churmanov, V. N., Ivanov, V. Y., Gruzdev, N. B., Sokolov, P. S., Baranov, A. N. & Moskvin, A. S., Jul 2012, In : JETP Letters. 95, 10, p. 528-533 6 p.
Research output: Contribution to journal › Article