@inproceedings{070f0aa80dbe43ac932527e4aaca53f5,
title = "Application of semiconductor laser emitters to thickness measurements",
keywords = "laser beam, laser diode, laser thickness gauge, light spot dimension, surface roughness, laser bean",
author = "Shlychkov, {V. I.}",
year = "2020",
month = nov,
day = "2",
doi = "10.1109/ICLO48556.2020.9285874",
language = "English",
series = "Proceedings - International Conference Laser Optics 2020, ICLO 2020",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "Proceedings - International Conference Laser Optics 2020, ICLO 2020",
address = "United States",
note = "2020 International Conference Laser Optics, ICLO 2020 ; Conference date: 02-11-2020 Through 06-11-2020",
}