Application of semiconductor laser emitters to thickness measurements

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Original languageEnglish
Title of host publicationProceedings - International Conference Laser Optics 2020, ICLO 2020
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages1
ISBN (Electronic)9781728152332
DOIs
Publication statusPublished - 2 Nov 2020
Event2020 International Conference Laser Optics, ICLO 2020 - St. Petersburg, Russian Federation
Duration: 2 Nov 20206 Nov 2020

Publication series

NameProceedings - International Conference Laser Optics 2020, ICLO 2020

Conference

Conference2020 International Conference Laser Optics, ICLO 2020
Country/TerritoryRussian Federation
CitySt. Petersburg
Period02/11/202006/11/2020

Keywords

  • laser beam
  • laser diode
  • laser thickness gauge
  • light spot dimension
  • surface roughness
  • laser bean

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics

WoS ResearchAreas Categories

  • Optics
  • Engineering, Electrical & Electronic
  • Physics, Applied

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