Enhancement of local piezoelectric properties of a perforated ferroelectric thin film visualized via piezoresponse force microscopy

M. S. Ivanov, N. E. Sherstyuk, E. D. Mishina, V. A. Khomchenko, A. Tselev, V. M. Mukhortov, J. A. Paixao, A. L. Kholkin

Research output: Contribution to journalArticleResearchpeer-review

1 Citation (Scopus)
Original languageEnglish
Article number425303
Number of pages6
JournalJournal of Physics D: Applied Physics
Volume50
Issue number42
DOIs
Publication statusPublished - 25 Oct 2017

Keywords

  • epitaxial ferroelectric film
  • focused ion beam milling
  • periodic photonic crystal
  • ferroelectricity enhancement
  • piezoresponse force microscopy
  • PERMITTIVITY
  • TUNABILITY
  • RECOVERY
  • DAMAGE

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Acoustics and Ultrasonics
  • Surfaces, Coatings and Films

WoS ResearchAreas Categories

  • Physics, Applied

Cite this

Ivanov, M. S. ; Sherstyuk, N. E. ; Mishina, E. D. ; Khomchenko, V. A. ; Tselev, A. ; Mukhortov, V. M. ; Paixao, J. A. ; Kholkin, A. L. / Enhancement of local piezoelectric properties of a perforated ferroelectric thin film visualized via piezoresponse force microscopy. In: Journal of Physics D: Applied Physics. 2017 ; Vol. 50, No. 42.
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Enhancement of local piezoelectric properties of a perforated ferroelectric thin film visualized via piezoresponse force microscopy. / Ivanov, M. S.; Sherstyuk, N. E.; Mishina, E. D.; Khomchenko, V. A.; Tselev, A.; Mukhortov, V. M.; Paixao, J. A.; Kholkin, A. L.

In: Journal of Physics D: Applied Physics, Vol. 50, No. 42, 425303, 25.10.2017.

Research output: Contribution to journalArticleResearchpeer-review

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T1 - Enhancement of local piezoelectric properties of a perforated ferroelectric thin film visualized via piezoresponse force microscopy

AU - Ivanov, M. S.

AU - Sherstyuk, N. E.

AU - Mishina, E. D.

AU - Khomchenko, V. A.

AU - Tselev, A.

AU - Mukhortov, V. M.

AU - Paixao, J. A.

AU - Kholkin, A. L.

PY - 2017/10/25

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KW - focused ion beam milling

KW - periodic photonic crystal

KW - ferroelectricity enhancement

KW - piezoresponse force microscopy

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KW - TUNABILITY

KW - RECOVERY

KW - DAMAGE

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