Imprint effect in PZT thin films at compositions around the morphotropic phase boundary

E. B. Araujo, E. C. Lima, I. K. Bdikin, A. L. Kholkin

Research output: Contribution to journalArticleResearchpeer-review

2 Citations (Scopus)
Original languageEnglish
Pages (from-to)18-26
Number of pages9
JournalFerroelectrics
Volume498
Issue number1
DOIs
Publication statusPublished - 31 Aug 2016

Fingerprint

Phase boundaries
Thin films
Point defects
Hysteresis loops
thin films
Chemical analysis
point defects
Vacancies
Microscopic examination
hysteresis
microscopy
Substrates

Keywords

  • Imprint
  • PZT
  • thin films
  • FERROELECTRIC CAPACITORS
  • SELF-POLARIZATION
  • MECHANISMS
  • BEHAVIOR

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

WoS ResearchAreas Categories

  • Materials Science, Multidisciplinary
  • Physics, Condensed Matter

Cite this

Araujo, E. B. ; Lima, E. C. ; Bdikin, I. K. ; Kholkin, A. L. / Imprint effect in PZT thin films at compositions around the morphotropic phase boundary. In: Ferroelectrics. 2016 ; Vol. 498, No. 1. pp. 18-26.
@article{e8455e2153ef4bfab132c2a06491fc84,
title = "Imprint effect in PZT thin films at compositions around the morphotropic phase boundary",
keywords = "Imprint, PZT, thin films, FERROELECTRIC CAPACITORS, SELF-POLARIZATION, MECHANISMS, BEHAVIOR",
author = "Araujo, {E. B.} and Lima, {E. C.} and Bdikin, {I. K.} and Kholkin, {A. L.}",
year = "2016",
month = "8",
day = "31",
doi = "10.1080/00150193.2016.1166421",
language = "English",
volume = "498",
pages = "18--26",
journal = "Ferroelectrics",
issn = "0015-0193",
publisher = "Taylor and Francis Ltd.",
number = "1",

}

Imprint effect in PZT thin films at compositions around the morphotropic phase boundary. / Araujo, E. B.; Lima, E. C.; Bdikin, I. K.; Kholkin, A. L.

In: Ferroelectrics, Vol. 498, No. 1, 31.08.2016, p. 18-26.

Research output: Contribution to journalArticleResearchpeer-review

TY - JOUR

T1 - Imprint effect in PZT thin films at compositions around the morphotropic phase boundary

AU - Araujo, E. B.

AU - Lima, E. C.

AU - Bdikin, I. K.

AU - Kholkin, A. L.

PY - 2016/8/31

Y1 - 2016/8/31

KW - Imprint

KW - PZT

KW - thin films

KW - FERROELECTRIC CAPACITORS

KW - SELF-POLARIZATION

KW - MECHANISMS

KW - BEHAVIOR

UR - http://www.scopus.com/inward/record.url?scp=84975143327&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000377049700003

U2 - 10.1080/00150193.2016.1166421

DO - 10.1080/00150193.2016.1166421

M3 - Article

VL - 498

SP - 18

EP - 26

JO - Ferroelectrics

JF - Ferroelectrics

SN - 0015-0193

IS - 1

ER -