In-plane polarization contribution to the vertical piezoresponse force microscopy signal mediated by the cantilever “buckling”

Research output: Contribution to journalArticle

Original languageEnglish
Article number148808
Number of pages7
JournalApplied Surface Science
Volume543
DOIs
Publication statusPublished - 30 Mar 2021

Keywords

  • Atomic force microscopy
  • Domain structure
  • Ferroelectricity
  • Piezoelectricity
  • Piezoresponse
  • Surface science

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

WoS ResearchAreas Categories

  • Chemistry, Physical
  • Materials Science, Coatings & Films
  • Physics, Applied
  • Physics, Condensed Matter

Fingerprint Dive into the research topics of 'In-plane polarization contribution to the vertical piezoresponse force microscopy signal mediated by the cantilever “buckling”'. Together they form a unique fingerprint.

Cite this