Latent ion tracks in amorphous and radiation amorphized silicon nitride

Arno Janse van Vuuren, Anel D. Ibrayeva, Jacques H. O'Connell, Vladimir A. Skuratov, Alisher Mutali, Maxim V. Zdorovets

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)16-23
Number of pages8
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume473
DOIs
Publication statusPublished - 15 Jun 2020

Keywords

  • Electron microscopy
  • Latent tracks
  • Radiation damage
  • Silicon nitride
  • Swift heavy ions

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

WoS ResearchAreas Categories

  • Instruments & Instrumentation
  • Nuclear Science & Technology
  • Physics, Atomic, Molecular & Chemical
  • Physics, Nuclear

Fingerprint Dive into the research topics of 'Latent ion tracks in amorphous and radiation amorphized silicon nitride'. Together they form a unique fingerprint.

Cite this