MicroRaman Study of Nanostructured Ultra-Thin AlGaN/GaN Thin Films Grown on Hybrid Compliant SiC/Por-Si Substrates

Aleksandr Lenshin, Pavel Seredin, Dmitry Goloshchapov, Ali O. Radam, Andrey Mizerov

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Article number626
JournalCoatings
Volume12
Issue number5
DOIs
Publication statusPublished - May 2022

Keywords

  • AN
  • porous silicon
  • Raman spectroscopy

ASJC Scopus subject areas

  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

WoS ResearchAreas Categories

  • Materials Science, Multidisciplinary
  • Materials Science, Coatings & Films
  • Physics, Applied

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