Nanoscale polarization relaxation and piezoelectric properties of SBN thin films

M. Melo, E. B. Araujo, M. Ivanov, V. Y. Shur, A. L. Kholkin

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publication2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages4
ISBN (Electronic)9781509018710
DOIs
Publication statusPublished - 27 Sep 2016
Event2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016 - Darmstadt, Germany
Duration: 21 Aug 201625 Aug 2016

Conference

Conference2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016
CountryGermany
CityDarmstadt
Period21/08/201625/08/2016

Fingerprint

Hysteresis loops
Polarization
Thin films
Microscopic examination
Oxygen vacancies
Ferroelectric materials
Electric fields
Defects
Electric potential
Substrates

Keywords

  • SBN films
  • piezoresponse
  • polarization relaxation
  • STRONTIUM BARIUM NIOBATE
  • CAPACITORS

ASJC Scopus subject areas

  • Ceramics and Composites
  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

WoS ResearchAreas Categories

  • Engineering, Electrical & Electronic
  • Physics, Applied

Cite this

Melo, M., Araujo, E. B., Ivanov, M., Shur, V. Y., & Kholkin, A. L. (2016). Nanoscale polarization relaxation and piezoelectric properties of SBN thin films. In 2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016 [7578084] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISAF.2016.7578084
Melo, M. ; Araujo, E. B. ; Ivanov, M. ; Shur, V. Y. ; Kholkin, A. L. / Nanoscale polarization relaxation and piezoelectric properties of SBN thin films. 2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016. Institute of Electrical and Electronics Engineers Inc., 2016.
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title = "Nanoscale polarization relaxation and piezoelectric properties of SBN thin films",
keywords = "SBN films, piezoresponse, polarization relaxation, STRONTIUM BARIUM NIOBATE, CAPACITORS",
author = "M. Melo and Araujo, {E. B.} and M. Ivanov and Shur, {V. Y.} and Kholkin, {A. L.}",
year = "2016",
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Melo, M, Araujo, EB, Ivanov, M, Shur, VY & Kholkin, AL 2016, Nanoscale polarization relaxation and piezoelectric properties of SBN thin films. in 2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016., 7578084, Institute of Electrical and Electronics Engineers Inc., 2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016, Darmstadt, Germany, 21/08/2016. https://doi.org/10.1109/ISAF.2016.7578084

Nanoscale polarization relaxation and piezoelectric properties of SBN thin films. / Melo, M.; Araujo, E. B.; Ivanov, M.; Shur, V. Y.; Kholkin, A. L.

2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016. Institute of Electrical and Electronics Engineers Inc., 2016. 7578084.

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

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T1 - Nanoscale polarization relaxation and piezoelectric properties of SBN thin films

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PY - 2016/9/27

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BT - 2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016

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Melo M, Araujo EB, Ivanov M, Shur VY, Kholkin AL. Nanoscale polarization relaxation and piezoelectric properties of SBN thin films. In 2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016. Institute of Electrical and Electronics Engineers Inc. 2016. 7578084 https://doi.org/10.1109/ISAF.2016.7578084