Original languageEnglish
Pages (from-to)978-983
Number of pages6
JournalApplied Surface Science
Volume441
DOIs
Publication statusPublished - 31 May 2018

Fingerprint

Boron
Graphite
Electron emission
Photoelectrons
Discrete Fourier transforms
Graphene
Copper
X rays
Oxidation
Impurities
Defects
Substrates
Vacancies
Density functional theory
Carbon
Flow rate
Corrosion
Oxygen
Coatings

Keywords

  • Boron
  • DFT
  • Doping
  • Graphene
  • Interface
  • XPS

ASJC Scopus subject areas

  • Surfaces, Coatings and Films

WoS ResearchAreas Categories

  • Chemistry, Physical
  • Materials Science, Coatings & Films
  • Physics, Applied
  • Physics, Condensed Matter

Cite this

@article{959e43864208406d86e9eae62726c12b,
title = "Stability of boron-doped graphene/copper interface: DFT, XPS and OSEE studies",
keywords = "Boron, DFT, Doping, Graphene, Interface, XPS",
author = "Boukhvalov, {D. W.} and Zhidkov, {I. S.} and Kukharenko, {A. I.} and Slesarev, {A. I.} and Zatsepin, {A. F.} and Cholakh, {S. O.} and Kurmaev, {E. Z.}",
year = "2018",
month = "5",
day = "31",
doi = "10.1016/j.apsusc.2018.02.074",
language = "English",
volume = "441",
pages = "978--983",
journal = "Applied Surface Science",
issn = "0169-4332",
publisher = "Elsevier BV",

}

TY - JOUR

T1 - Stability of boron-doped graphene/copper interface: DFT, XPS and OSEE studies

AU - Boukhvalov, D. W.

AU - Zhidkov, I. S.

AU - Kukharenko, A. I.

AU - Slesarev, A. I.

AU - Zatsepin, A. F.

AU - Cholakh, S. O.

AU - Kurmaev, E. Z.

PY - 2018/5/31

Y1 - 2018/5/31

KW - Boron

KW - DFT

KW - Doping

KW - Graphene

KW - Interface

KW - XPS

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UR - https://elibrary.ru/item.asp?id=35514987

U2 - 10.1016/j.apsusc.2018.02.074

DO - 10.1016/j.apsusc.2018.02.074

M3 - Article

VL - 441

SP - 978

EP - 983

JO - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

ER -