Super-resolution Photonic Nanojet Interferometry: Photonic Nanojet Interaction with a Polymer Sample

Maria Gritsevich, Goran Maconi, Anton Nolvi, Ivan Kassamakov, Antti Penttila, Karri Muinonen, Edward Haeggstrom

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

Original languageEnglish
Title of host publicationOptical Measurement Systems for Industrial Inspection X
EditorsP Lehmann, W Osten, AA Goncalves
PublisherSPIE International Optical Engineering
Number of pages7
Volume10329
ISBN (Electronic)9781510611030
ISBN (Print)978-1-5106-1103-0
DOIs
Publication statusPublished - 2017
EventConference on Optical Measurement Systems for Industrial Inspection X part of the SPIE Optical Metrology Symposium - Munich, Germany
Duration: 26 Jun 201729 Jun 2017

Publication series

NameProceedings of SPIE
PublisherSPIE-INT SOC OPTICAL ENGINEERING
Volume10329
ISSN (Print)0277-786X

Conference

ConferenceConference on Optical Measurement Systems for Industrial Inspection X part of the SPIE Optical Metrology Symposium
CountryGermany
CityMunich
Period26/06/201729/06/2017

Keywords

  • label-free imaging
  • super-resolution microscopy
  • LIGHT

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

WoS ResearchAreas Categories

  • Instruments & Instrumentation
  • Optics

Cite this

Gritsevich, M., Maconi, G., Nolvi, A., Kassamakov, I., Penttila, A., Muinonen, K., & Haeggstrom, E. (2017). Super-resolution Photonic Nanojet Interferometry: Photonic Nanojet Interaction with a Polymer Sample. In P. Lehmann, W. Osten, & AA. Goncalves (Eds.), Optical Measurement Systems for Industrial Inspection X (Vol. 10329). [103291B] (Proceedings of SPIE; Vol. 10329). SPIE International Optical Engineering. https://doi.org/10.1117/12.2269519
Gritsevich, Maria ; Maconi, Goran ; Nolvi, Anton ; Kassamakov, Ivan ; Penttila, Antti ; Muinonen, Karri ; Haeggstrom, Edward. / Super-resolution Photonic Nanojet Interferometry: Photonic Nanojet Interaction with a Polymer Sample. Optical Measurement Systems for Industrial Inspection X. editor / P Lehmann ; W Osten ; AA Goncalves. Vol. 10329 SPIE International Optical Engineering, 2017. (Proceedings of SPIE).
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author = "Maria Gritsevich and Goran Maconi and Anton Nolvi and Ivan Kassamakov and Antti Penttila and Karri Muinonen and Edward Haeggstrom",
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Gritsevich, M, Maconi, G, Nolvi, A, Kassamakov, I, Penttila, A, Muinonen, K & Haeggstrom, E 2017, Super-resolution Photonic Nanojet Interferometry: Photonic Nanojet Interaction with a Polymer Sample. in P Lehmann, W Osten & AA Goncalves (eds), Optical Measurement Systems for Industrial Inspection X. vol. 10329, 103291B, Proceedings of SPIE, vol. 10329, SPIE International Optical Engineering, Conference on Optical Measurement Systems for Industrial Inspection X part of the SPIE Optical Metrology Symposium, Munich, Germany, 26/06/2017. https://doi.org/10.1117/12.2269519

Super-resolution Photonic Nanojet Interferometry: Photonic Nanojet Interaction with a Polymer Sample. / Gritsevich, Maria; Maconi, Goran; Nolvi, Anton; Kassamakov, Ivan; Penttila, Antti; Muinonen, Karri; Haeggstrom, Edward.

Optical Measurement Systems for Industrial Inspection X. ed. / P Lehmann; W Osten; AA Goncalves. Vol. 10329 SPIE International Optical Engineering, 2017. 103291B (Proceedings of SPIE; Vol. 10329).

Research output: Chapter in Book/Report/Conference proceedingConference contributionResearchpeer-review

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T1 - Super-resolution Photonic Nanojet Interferometry: Photonic Nanojet Interaction with a Polymer Sample

AU - Gritsevich, Maria

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AU - Muinonen, Karri

AU - Haeggstrom, Edward

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SN - 978-1-5106-1103-0

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BT - Optical Measurement Systems for Industrial Inspection X

A2 - Lehmann, P

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Gritsevich M, Maconi G, Nolvi A, Kassamakov I, Penttila A, Muinonen K et al. Super-resolution Photonic Nanojet Interferometry: Photonic Nanojet Interaction with a Polymer Sample. In Lehmann P, Osten W, Goncalves AA, editors, Optical Measurement Systems for Industrial Inspection X. Vol. 10329. SPIE International Optical Engineering. 2017. 103291B. (Proceedings of SPIE). https://doi.org/10.1117/12.2269519