ОСОБЕННОСТИ ГРАДУИРОВКИ РЕНТГЕНОФЛУОРЕСЦЕНТНОГО СПЕКТРОМЕТРА С ПОЛНЫМ ВНЕШНИМ ОТРАЖЕНИЕМ "NANOHUNTER" С ИСПОЛЬЗОВАНИЕМ СТАНДАРТНЫХ ОБРАЗЦОВ РАСТВОРОВ ЭЛЕМЕНТОВ

Resultado de la investigación: Article

Resumen

Although X-ray fluorescence spectrometry (XRF) is well-established and widely used technique for elemental analysis, XRF devices with total external reflection (TXRF) only recently became available for research and industrial laboratories. As the number of TXRF devices in use rises, the problems related to certification, calibration and standardization become more important. In this contribution we describe major steps of sample preparation, interpretation of the results obtained and graduation of the device. The study was performed on standard multielement solutions using TXRF spectrometer Nanohunter, manufactured by Rigaku Corp.
Título traducido de la contribuciónSPECIFIC FEATURES OF CALIBRATION OF X-RAY FLUORESCENCE SPECTROMETER WITH TOTAL EXTERNAL REFLECTION "NANOHUNTER" USING REFERENCE MATERIALS OF ELEMENT SOLUTIONS
Idioma originalRussian
Páginas (desde-hasta)25-29
PublicaciónСтандартные образцы
N.º4
EstadoPublished - 2013

GRNTI

  • 29.31.00

Level of Research Output

  • VAK List

Huella Profundice en los temas de investigación de 'ОСОБЕННОСТИ ГРАДУИРОВКИ РЕНТГЕНОФЛУОРЕСЦЕНТНОГО СПЕКТРОМЕТРА С ПОЛНЫМ ВНЕШНИМ ОТРАЖЕНИЕМ "NANOHUNTER" С ИСПОЛЬЗОВАНИЕМ СТАНДАРТНЫХ ОБРАЗЦОВ РАСТВОРОВ ЭЛЕМЕНТОВ'. En conjunto forman una huella única.

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