Electron microscopic imaging of an ion beam mixed SiO 2/Si interface correlated with photo- and cathodoluminescence

H. J. Fitting, L. Fitting Kourkoutis, B. Schmidt, B. Liedke, E. V. Ivanova, M. V. Zamoryanskaya, V. A. Pustovarov, A. F. Zatsepin

Resultado de la investigación: Articlerevisión exhaustiva

6 Citas (Scopus)
Idioma originalEnglish
Páginas (desde-hasta)1101-1108
Número de páginas8
PublicaciónPhysica Status Solidi (A) Applications and Materials Science
Volumen209
N.º6
DOI
EstadoPublished - jun 2012

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

WoS ResearchAreas Categories

  • Materials Science, Multidisciplinary
  • Physics, Applied
  • Physics, Condensed Matter

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