Defect concentration in nitrogen-doped graphene grown on Cu substrate: A thickness effect › Research Explorer

Defect concentration in nitrogen-doped graphene grown on Cu substrate: A thickness effect

Research output: Contribution to journal › Article › peer-review

DOI

https://doi.org/10.1016/j.physb.2017.03.004
Final published version

Dhananjay K. Sharma
Sara Fateixa
María J. Hortigüela
Reddithota Vidyasagar
Gonzalo Otero-Irurueta
Helena I S Nogueira
Manoj Kumar Singh
Andrei Kholkin

Original language	English
Pages (from-to)	62-68
Number of pages	7
Journal	Physica B: Condensed Matter
Volume	513
DOIs	https://doi.org/10.1016/j.physb.2017.03.004
Publication status	Published - 15 May 2017

WoS ResearchAreas Categories

Physics, Condensed Matter

Research areas

CVD, Defects, Graphene, High Resolution-X-ray Photoelectron Spectroscopy (HR-XPS), Nitrogen-doping, Raman

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

ID: 1692526