Computer simulation and analysis of atomistic and electron properties of defect ZnO structures

Результат исследований: Глава в книге, отчете, сборнике статейМатериалы конференцииНаучно-исследовательскаярецензирование

Язык оригиналаАнглийский
Название основной публикацииInternational Conference on Numerical Analysis and Applied Mathematics, ICNAAM 2018
РедакторыT.E. Simos, T.E. Simos, T.E. Simos, T.E. Simos, Ch. Tsitouras, T.E. Simos
ИздательAmerican Institute of Physics Inc.
ISBN (электронное издание)9780735418547
DOI
СостояниеОпубликовано - 24 июл 2019
СобытиеInternational Conference on Numerical Analysis and Applied Mathematics 2018, ICNAAM 2018 - Rhodes, Греция
Продолжительность: 13 сен 201818 сен 2018

Серия публикаций

НазваниеAIP Conference Proceedings
Том2116
ISSN (печатное издание)0094-243X
ISSN (электронное издание)1551-7616

Конференция

КонференцияInternational Conference on Numerical Analysis and Applied Mathematics 2018, ICNAAM 2018
СтранаГреция
ГородRhodes
Период13/09/201818/09/2018

Отпечаток

computer analysis
computer simulation
electronics
defect
computerized simulation
electrons
electricity
electron
conductivity
point defects
radio electronics
defects
zinc oxide
multipliers
simulation
zinc oxides
radio
lattice dynamics
manufacturing
methodology

Ключевые слова

    Предметные области ASJC Scopus

    • Ecology, Evolution, Behavior and Systematics
    • Ecology
    • Plant Science
    • Physics and Astronomy(all)
    • Nature and Landscape Conservation

    Цитировать

    Vinogradova, N. S., & Sosnovsky, A. V. (2019). Computer simulation and analysis of atomistic and electron properties of defect ZnO structures. В T. E. Simos, T. E. Simos, T. E. Simos, T. E. Simos, C. Tsitouras, & T. E. Simos (Ред.), International Conference on Numerical Analysis and Applied Mathematics, ICNAAM 2018 [390019] (AIP Conference Proceedings; Том 2116). American Institute of Physics Inc.. https://doi.org/10.1063/1.5114414
    Vinogradova, Nina S. ; Sosnovsky, Andrey V. / Computer simulation and analysis of atomistic and electron properties of defect ZnO structures. International Conference on Numerical Analysis and Applied Mathematics, ICNAAM 2018. редактор / T.E. Simos ; T.E. Simos ; T.E. Simos ; T.E. Simos ; Ch. Tsitouras ; T.E. Simos. American Institute of Physics Inc., 2019. (AIP Conference Proceedings).
    @inproceedings{42f8fcf1cc2343a889404688cd9f3c04,
    title = "Computer simulation and analysis of atomistic and electron properties of defect ZnO structures",
    keywords = "ab into simulation, atomistic calculation, Electronic structure simulation, point defects simulation, Zno",
    author = "Vinogradova, {Nina S.} and Sosnovsky, {Andrey V.}",
    year = "2019",
    month = "7",
    day = "24",
    doi = "10.1063/1.5114414",
    language = "English",
    series = "AIP Conference Proceedings",
    publisher = "American Institute of Physics Inc.",
    editor = "T.E. Simos and T.E. Simos and T.E. Simos and T.E. Simos and Ch. Tsitouras and T.E. Simos",
    booktitle = "International Conference on Numerical Analysis and Applied Mathematics, ICNAAM 2018",
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    Vinogradova, NS & Sosnovsky, AV 2019, Computer simulation and analysis of atomistic and electron properties of defect ZnO structures. в TE Simos, TE Simos, TE Simos, TE Simos, C Tsitouras & TE Simos (ред.), International Conference on Numerical Analysis and Applied Mathematics, ICNAAM 2018., 390019, AIP Conference Proceedings, том. 2116, American Institute of Physics Inc., International Conference on Numerical Analysis and Applied Mathematics 2018, ICNAAM 2018, Rhodes, Греция, 13/09/2018. https://doi.org/10.1063/1.5114414

    Computer simulation and analysis of atomistic and electron properties of defect ZnO structures. / Vinogradova, Nina S.; Sosnovsky, Andrey V.

    International Conference on Numerical Analysis and Applied Mathematics, ICNAAM 2018. ред. / T.E. Simos; T.E. Simos; T.E. Simos; T.E. Simos; Ch. Tsitouras; T.E. Simos. American Institute of Physics Inc., 2019. 390019 (AIP Conference Proceedings; Том 2116).

    Результат исследований: Глава в книге, отчете, сборнике статейМатериалы конференцииНаучно-исследовательскаярецензирование

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    KW - Electronic structure simulation

    KW - point defects simulation

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    Vinogradova NS, Sosnovsky AV. Computer simulation and analysis of atomistic and electron properties of defect ZnO structures. В Simos TE, Simos TE, Simos TE, Simos TE, Tsitouras C, Simos TE, редакторы, International Conference on Numerical Analysis and Applied Mathematics, ICNAAM 2018. American Institute of Physics Inc. 2019. 390019. (AIP Conference Proceedings). https://doi.org/10.1063/1.5114414