Electromechanical Measurements of Gd-Doped Ceria Thin Films by Laser Interferometry

A. D. Ushakov, N. Yavo, E. Mishuk, I. Lubomirsky, V. Ya. Shur, A. L. Kholkin

Результат исследований: Глава в книге, отчете, сборнике статейМатериалы конференцииНаучно-исследовательскаярецензирование

Язык оригиналаАнглийский
Название основной публикацииIV SINO-RUSSIAN ASRTU SYMPOSIUM ON ADVANCED MATERIALS AND PROCESSING TECHNOLOGY
РедакторыVY Shur
ИздательKNOWLEDGE E
Страницы177-182
Число страниц6
DOI
СостояниеОпубликовано - 2016
Событие4th Sino-Russian ASRTU Symposium on Advanced Materials and Processing Technology - Ekaterinburg
Продолжительность: 23 июн 201626 июн 2016

Серия публикаций

НазваниеKnE Materials Science
ИздательKNOWLEDGE E
Том2016
ISSN (печатное издание)2519-1438

Конференция

Конференция4th Sino-Russian ASRTU Symposium on Advanced Materials and Processing Technology
ГородEkaterinburg
Период23/06/201626/06/2016

Ключевые слова

    Предметные области WoS

    • Технологии, Машиностроение
    • Технологии, Промышленные

    Цитировать

    Ushakov, A. D., Yavo, N., Mishuk, E., Lubomirsky, I., Shur, V. Y., & Kholkin, A. L. (2016). Electromechanical Measurements of Gd-Doped Ceria Thin Films by Laser Interferometry. В VY. Shur (Ред.), IV SINO-RUSSIAN ASRTU SYMPOSIUM ON ADVANCED MATERIALS AND PROCESSING TECHNOLOGY (стр. 177-182). (KnE Materials Science; Том 2016). KNOWLEDGE E. https://doi.org/10.18502/kms.v1i1.582
    Ushakov, A. D. ; Yavo, N. ; Mishuk, E. ; Lubomirsky, I. ; Shur, V. Ya. ; Kholkin, A. L. / Electromechanical Measurements of Gd-Doped Ceria Thin Films by Laser Interferometry. IV SINO-RUSSIAN ASRTU SYMPOSIUM ON ADVANCED MATERIALS AND PROCESSING TECHNOLOGY. редактор / VY Shur. KNOWLEDGE E, 2016. стр. 177-182 (KnE Materials Science).
    @inproceedings{39cd6b4759244560af1e77c49ad94d67,
    title = "Electromechanical Measurements of Gd-Doped Ceria Thin Films by Laser Interferometry",
    keywords = "gadolinium doped ceria, thin films, laser interferometry, electrostriction, ELECTROSTRICTION",
    author = "Ushakov, {A. D.} and N. Yavo and E. Mishuk and I. Lubomirsky and Shur, {V. Ya.} and Kholkin, {A. L.}",
    year = "2016",
    doi = "10.18502/kms.v1i1.582",
    language = "English",
    series = "KnE Materials Science",
    publisher = "KNOWLEDGE E",
    pages = "177--182",
    editor = "VY Shur",
    booktitle = "IV SINO-RUSSIAN ASRTU SYMPOSIUM ON ADVANCED MATERIALS AND PROCESSING TECHNOLOGY",
    address = "Unknown",

    }

    Ushakov, AD, Yavo, N, Mishuk, E, Lubomirsky, I, Shur, VY & Kholkin, AL 2016, Electromechanical Measurements of Gd-Doped Ceria Thin Films by Laser Interferometry. в VY Shur (ред.), IV SINO-RUSSIAN ASRTU SYMPOSIUM ON ADVANCED MATERIALS AND PROCESSING TECHNOLOGY. KnE Materials Science, том. 2016, KNOWLEDGE E, стр. 177-182, 4th Sino-Russian ASRTU Symposium on Advanced Materials and Processing Technology, Ekaterinburg, 23/06/2016. https://doi.org/10.18502/kms.v1i1.582

    Electromechanical Measurements of Gd-Doped Ceria Thin Films by Laser Interferometry. / Ushakov, A. D.; Yavo, N.; Mishuk, E.; Lubomirsky, I.; Shur, V. Ya.; Kholkin, A. L.

    IV SINO-RUSSIAN ASRTU SYMPOSIUM ON ADVANCED MATERIALS AND PROCESSING TECHNOLOGY. ред. / VY Shur. KNOWLEDGE E, 2016. стр. 177-182 (KnE Materials Science; Том 2016).

    Результат исследований: Глава в книге, отчете, сборнике статейМатериалы конференцииНаучно-исследовательскаярецензирование

    TY - GEN

    T1 - Electromechanical Measurements of Gd-Doped Ceria Thin Films by Laser Interferometry

    AU - Ushakov, A. D.

    AU - Yavo, N.

    AU - Mishuk, E.

    AU - Lubomirsky, I.

    AU - Shur, V. Ya.

    AU - Kholkin, A. L.

    PY - 2016

    Y1 - 2016

    KW - gadolinium doped ceria

    KW - thin films

    KW - laser interferometry

    KW - electrostriction

    KW - ELECTROSTRICTION

    UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000395106000030

    U2 - 10.18502/kms.v1i1.582

    DO - 10.18502/kms.v1i1.582

    M3 - Conference contribution

    T3 - KnE Materials Science

    SP - 177

    EP - 182

    BT - IV SINO-RUSSIAN ASRTU SYMPOSIUM ON ADVANCED MATERIALS AND PROCESSING TECHNOLOGY

    A2 - Shur, VY

    PB - KNOWLEDGE E

    ER -

    Ushakov AD, Yavo N, Mishuk E, Lubomirsky I, Shur VY, Kholkin AL. Electromechanical Measurements of Gd-Doped Ceria Thin Films by Laser Interferometry. В Shur VY, редактор, IV SINO-RUSSIAN ASRTU SYMPOSIUM ON ADVANCED MATERIALS AND PROCESSING TECHNOLOGY. KNOWLEDGE E. 2016. стр. 177-182. (KnE Materials Science). https://doi.org/10.18502/kms.v1i1.582