Electron microscopic imaging of an ion beam mixed SiO 2/Si interface correlated with photo- and cathodoluminescence

H. J. Fitting; L. Fitting Kourkoutis; B. Schmidt; B. Liedke; E. V. Ivanova; M. V. Zamoryanskaya; V. A. Pustovarov; A. F. Zatsepin

doi:10.1002/pssa.201127617

Electron microscopic imaging of an ion beam mixed SiO 2/Si interface correlated with photo- and cathodoluminescence

H. J. Fitting, L. Fitting Kourkoutis, B. Schmidt, B. Liedke, E. V. Ivanova, M. V. Zamoryanskaya, V. A. Pustovarov, A. F. Zatsepin

Результат исследований: Вклад в журнал › Статья

6 Цитирования (Scopus)

Язык оригинала	Английский
Страницы (с-по)	1101-1108
Число страниц	8
Журнал	Physica Status Solidi (A) Applications and Materials Science
Том	209
Номер выпуска	6
DOI	https://doi.org/10.1002/pssa.201127617
Состояние	Опубликовано - июн 2012

Предметные области ASJC Scopus

Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials
Materials Chemistry
Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films

Предметные области WoS

Материаловедение, Междисциплинарные труды
Физика, Прикладная
Физика, Конденсированных сред

Ссылки

10.1002/pssa.201127617

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Цитировать

Fitting, H. J., Fitting Kourkoutis, L., Schmidt, B., Liedke, B., Ivanova, E. V., Zamoryanskaya, M. V., Pustovarov, V. A., & Zatsepin, A. F. (2012). Electron microscopic imaging of an ion beam mixed SiO 2/Si interface correlated with photo- and cathodoluminescence. Physica Status Solidi (A) Applications and Materials Science, 209(6), 1101-1108. https://doi.org/10.1002/pssa.201127617

Fitting, H. J. ; Fitting Kourkoutis, L. ; Schmidt, B. ; Liedke, B. ; Ivanova, E. V. ; Zamoryanskaya, M. V. ; Pustovarov, V. A. ; Zatsepin, A. F. / Electron microscopic imaging of an ion beam mixed SiO 2/Si interface correlated with photo- and cathodoluminescence. В: Physica Status Solidi (A) Applications and Materials Science. 2012 ; Том 209, № 6. стр. 1101-1108.

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title = "Electron microscopic imaging of an ion beam mixed SiO 2/Si interface correlated with photo- and cathodoluminescence",

keywords = "cathodoluminescence, energy-filtered TEM, ion beam mixing, silicon suboxides",

author = "Fitting, {H. J.} and {Fitting Kourkoutis}, L. and B. Schmidt and B. Liedke and Ivanova, {E. V.} and Zamoryanskaya, {M. V.} and Pustovarov, {V. A.} and Zatsepin, {A. F.}",

year = "2012",

month = jun,

doi = "10.1002/pssa.201127617",

language = "English",

volume = "209",

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journal = "Physica Status Solidi (A) Applications and Materials Science",

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Fitting, HJ, Fitting Kourkoutis, L, Schmidt, B, Liedke, B, Ivanova, EV, Zamoryanskaya, MV, Pustovarov, VA & Zatsepin, AF 2012, 'Electron microscopic imaging of an ion beam mixed SiO 2/Si interface correlated with photo- and cathodoluminescence', Physica Status Solidi (A) Applications and Materials Science, том. 209, № 6, стр. 1101-1108. https://doi.org/10.1002/pssa.201127617

Electron microscopic imaging of an ion beam mixed SiO 2/Si interface correlated with photo- and cathodoluminescence. / Fitting, H. J.; Fitting Kourkoutis, L.; Schmidt, B.; Liedke, B.; Ivanova, E. V.; Zamoryanskaya, M. V.; Pustovarov, V. A.; Zatsepin, A. F.

В: Physica Status Solidi (A) Applications and Materials Science, Том 209, № 6, 06.2012, стр. 1101-1108.

Результат исследований: Вклад в журнал › Статья

TY - JOUR

T1 - Electron microscopic imaging of an ion beam mixed SiO 2/Si interface correlated with photo- and cathodoluminescence

AU - Fitting, H. J.

AU - Fitting Kourkoutis, L.

AU - Schmidt, B.

AU - Liedke, B.

AU - Ivanova, E. V.

AU - Zamoryanskaya, M. V.

AU - Pustovarov, V. A.

AU - Zatsepin, A. F.

PY - 2012/6

Y1 - 2012/6

KW - cathodoluminescence

KW - energy-filtered TEM

KW - ion beam mixing

KW - silicon suboxides

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DO - 10.1002/pssa.201127617

M3 - Article

AN - SCOPUS:84862221524

VL - 209

SP - 1101

EP - 1108

JO - Physica Status Solidi (A) Applications and Materials Science

JF - Physica Status Solidi (A) Applications and Materials Science

SN - 1862-6300

IS - 6

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