Field ion microscopy of radiation defects in fcc materials at atomic-level spatial

Vladimir Aleksandrovich Ivchenko

Field ion microscopy of radiation defects in fcc materials at atomic-level spatial

Институт новых материалов и технологий

Результат исследований: Вклад в журнал › Статья

Язык оригинала	Английский
Страницы (с-по)	1112-1116
Число страниц	5
Журнал	Biointerface Research in Applied Chemistry
Том	6
Номер выпуска	2
Состояние	Опубликовано - 15 апр 2016

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https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000375611200007

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title = "Field ion microscopy of radiation defects in fcc materials at atomic-level spatial",

keywords = "radiation defects, cascades of atomic displacements, fast neutrons, Ar+ beams, field ion microscopy",

author = "Ivchenko, {Vladimir Aleksandrovich}",

year = "2016",

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language = "English",

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AU - Ivchenko, Vladimir Aleksandrovich

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KW - radiation defects

KW - cascades of atomic displacements

KW - fast neutrons

KW - Ar+ beams

KW - field ion microscopy

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JO - Biointerface Research in Applied Chemistry

JF - Biointerface Research in Applied Chemistry

SN - 2069-5837

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