Millimeter Wave Resistance of Metal-Dielectric Co-x(SiO2)(1-x) and Co-x(Al2O3)(1-x) Films

Anatoly B. Rinkevich, Dmitry V. Perov, Vladimir O. Vaskovsky, Alexandr N. Gorkovenko, Evgeny A. Kuznetsov

Результат исследований: Вклад в журналСтатьяНаучно-исследовательскаярецензирование

Язык оригиналаАнглийский
Номер статьи8023889
Страницы (с-по)1067-1072
Число страниц6
ЖурналIEEE Transactions on Nanotechnology
Том16
Номер выпуска6
DOI
СостояниеОпубликовано - ноя 2017

Ключевые слова

    Предметные области ASJC Scopus

    • Computer Science Applications
    • Electrical and Electronic Engineering

    Предметные области WoS

    • Технологии, Электротехника и электроника
    • Нанотехнологии
    • Материаловедение, Междисциплинарные труды

    Цитировать

    Rinkevich, Anatoly B. ; Perov, Dmitry V. ; Vaskovsky, Vladimir O. ; Gorkovenko, Alexandr N. ; Kuznetsov, Evgeny A. / Millimeter Wave Resistance of Metal-Dielectric Co-x(SiO2)(1-x) and Co-x(Al2O3)(1-x) Films. В: IEEE Transactions on Nanotechnology. 2017 ; Том 16, № 6. стр. 1067-1072.
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    keywords = "Microwave measurement, microwave and dc conductivity, thin-film nanocomposite, waveguide, CO-SIO2 GRANULAR FILMS, MAGNETORESISTANCE, HETEROSTRUCTURE, TITANATES",
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    year = "2017",
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    Millimeter Wave Resistance of Metal-Dielectric Co-x(SiO2)(1-x) and Co-x(Al2O3)(1-x) Films. / Rinkevich, Anatoly B.; Perov, Dmitry V.; Vaskovsky, Vladimir O.; Gorkovenko, Alexandr N.; Kuznetsov, Evgeny A.

    В: IEEE Transactions on Nanotechnology, Том 16, № 6, 8023889, 11.2017, стр. 1067-1072.

    Результат исследований: Вклад в журналСтатьяНаучно-исследовательскаярецензирование

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    AU - Rinkevich, Anatoly B.

    AU - Perov, Dmitry V.

    AU - Vaskovsky, Vladimir O.

    AU - Gorkovenko, Alexandr N.

    AU - Kuznetsov, Evgeny A.

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    KW - microwave and dc conductivity

    KW - thin-film nanocomposite

    KW - waveguide

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    KW - MAGNETORESISTANCE

    KW - HETEROSTRUCTURE

    KW - TITANATES

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