Nanoscale polarization relaxation and piezoelectric properties of SBN thin films

M. Melo, E. B. Araujo, M. Ivanov, V. Y. Shur, A. L. Kholkin

Результат исследований: Глава в книге, отчете, сборнике статейМатериалы конференцииНаучно-исследовательскаярецензирование

Язык оригиналаАнглийский
Название основной публикации2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016
ИздательInstitute of Electrical and Electronics Engineers Inc.
Число страниц4
ISBN (электронное издание)9781509018710
DOI
СостояниеОпубликовано - 27 сен 2016
Событие2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016 - Darmstadt, Германия
Продолжительность: 21 авг 201625 авг 2016

Конференция

Конференция2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016
СтранаГермания
ГородDarmstadt
Период21/08/201625/08/2016

Отпечаток

Hysteresis loops
Polarization
Thin films
Microscopic examination
Oxygen vacancies
Ferroelectric materials
Electric fields
Defects
Electric potential
Substrates

Ключевые слова

    Предметные области ASJC Scopus

    • Ceramics and Composites
    • Electronic, Optical and Magnetic Materials
    • Electrical and Electronic Engineering

    Предметные области WoS

    • Технологии, Электро и электронные
    • Физика, Прикладная

    Цитировать

    Melo, M., Araujo, E. B., Ivanov, M., Shur, V. Y., & Kholkin, A. L. (2016). Nanoscale polarization relaxation and piezoelectric properties of SBN thin films. В 2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016 [7578084] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISAF.2016.7578084
    Melo, M. ; Araujo, E. B. ; Ivanov, M. ; Shur, V. Y. ; Kholkin, A. L. / Nanoscale polarization relaxation and piezoelectric properties of SBN thin films. 2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016. Institute of Electrical and Electronics Engineers Inc., 2016.
    @inproceedings{0cf6a99ed3ec466d9b00253956134312,
    title = "Nanoscale polarization relaxation and piezoelectric properties of SBN thin films",
    keywords = "SBN films, piezoresponse, polarization relaxation, STRONTIUM BARIUM NIOBATE, CAPACITORS",
    author = "M. Melo and Araujo, {E. B.} and M. Ivanov and Shur, {V. Y.} and Kholkin, {A. L.}",
    year = "2016",
    month = "9",
    day = "27",
    doi = "10.1109/ISAF.2016.7578084",
    language = "English",
    booktitle = "2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016",
    publisher = "Institute of Electrical and Electronics Engineers Inc.",
    address = "United States",

    }

    Melo, M, Araujo, EB, Ivanov, M, Shur, VY & Kholkin, AL 2016, Nanoscale polarization relaxation and piezoelectric properties of SBN thin films. в 2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016., 7578084, Institute of Electrical and Electronics Engineers Inc., 2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016, Darmstadt, Германия, 21/08/2016. https://doi.org/10.1109/ISAF.2016.7578084

    Nanoscale polarization relaxation and piezoelectric properties of SBN thin films. / Melo, M.; Araujo, E. B.; Ivanov, M.; Shur, V. Y.; Kholkin, A. L.

    2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016. Institute of Electrical and Electronics Engineers Inc., 2016. 7578084.

    Результат исследований: Глава в книге, отчете, сборнике статейМатериалы конференцииНаучно-исследовательскаярецензирование

    TY - GEN

    T1 - Nanoscale polarization relaxation and piezoelectric properties of SBN thin films

    AU - Melo, M.

    AU - Araujo, E. B.

    AU - Ivanov, M.

    AU - Shur, V. Y.

    AU - Kholkin, A. L.

    PY - 2016/9/27

    Y1 - 2016/9/27

    KW - SBN films

    KW - piezoresponse

    KW - polarization relaxation

    KW - STRONTIUM BARIUM NIOBATE

    KW - CAPACITORS

    UR - http://www.scopus.com/inward/record.url?scp=84994180663&partnerID=8YFLogxK

    UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000391250700024

    U2 - 10.1109/ISAF.2016.7578084

    DO - 10.1109/ISAF.2016.7578084

    M3 - Conference contribution

    BT - 2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016

    PB - Institute of Electrical and Electronics Engineers Inc.

    ER -

    Melo M, Araujo EB, Ivanov M, Shur VY, Kholkin AL. Nanoscale polarization relaxation and piezoelectric properties of SBN thin films. В 2016 Joint IEEE International Symposium on the Applications of Ferroelectrics, European Conference on Application of Polar Dielectrics, and Piezoelectric Force Microscopy Workshop, ISAF/ECAPD/PFM 2016. Institute of Electrical and Electronics Engineers Inc. 2016. 7578084 https://doi.org/10.1109/ISAF.2016.7578084