Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence

V. I. Sokolov, V. A. Pustovarov, V. N. Churmanov, V. Yu Ivanov, N. B. Gruzdev, P. S. Sokolov, A. N. Baranov, A. S. Moskvin

Результат исследований: Вклад в журналСтатья

Аннотация

Soft X-ray (XUV) excitation did make it possible to avoid the predominant role of the surface effects in luminescence of NiO and revealed a bulk luminescence with a puzzling well isolated doublet of very narrow lines with close energies near 3. 3 eV which is assigned to recombination transitions in self-trapped d-d charge transfer (CT) excitons formed by coupled Jahn-Teller Ni + and Ni 3+ centers. The conclusion is supported both by a comparative analysis of the CT luminescence spectra for NiO and solid solutions Ni xZn 1 - xO, and by a comprehensive cluster model assignment of different p-d and d-d CT transitions, their relaxation channels. To the best of our knowledge, it is the first observation of the luminescence due to self-trapped d-d CT excitons.

Язык оригиналаАнглийский
Страницы (с-по)595-600
Число страниц6
ЖурналJETP Letters
Том95
Номер выпуска10
СостояниеОпубликовано - июл 2012

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