Super-resolution Photonic Nanojet Interferometry: Photonic Nanojet Interaction with a Polymer Sample

Maria Gritsevich, Goran Maconi, Anton Nolvi, Ivan Kassamakov, Antti Penttila, Karri Muinonen, Edward Haeggstrom

Результат исследований: Глава в книге, отчете, сборнике статейМатериалы конференцииНаучно-исследовательскаярецензирование

Язык оригиналаАнглийский
Название основной публикацииOptical Measurement Systems for Industrial Inspection X
РедакторыP Lehmann, W Osten, AA Goncalves
ИздательSPIE International Optical Engineering
Число страниц7
Том10329
ISBN (электронное издание)9781510611030
ISBN (печатное издание)978-1-5106-1103-0
DOI
СостояниеОпубликовано - 2017
СобытиеConference on Optical Measurement Systems for Industrial Inspection X part of the SPIE Optical Metrology Symposium - Munich, Германия
Продолжительность: 26 июн 201729 июн 2017

Серия публикаций

НазваниеProceedings of SPIE
ИздательSPIE-INT SOC OPTICAL ENGINEERING
Том10329
ISSN (печатное издание)0277-786X

Конференция

КонференцияConference on Optical Measurement Systems for Industrial Inspection X part of the SPIE Optical Metrology Symposium
СтранаГермания
ГородMunich
Период26/06/201729/06/2017

Ключевые слова

    Предметные области ASJC Scopus

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Computer Science Applications
    • Applied Mathematics
    • Electrical and Electronic Engineering

    Предметные области WoS

    • Инструменты и контрольно-измерительные технологии
    • Оптика

    Цитировать

    Gritsevich, M., Maconi, G., Nolvi, A., Kassamakov, I., Penttila, A., Muinonen, K., & Haeggstrom, E. (2017). Super-resolution Photonic Nanojet Interferometry: Photonic Nanojet Interaction with a Polymer Sample. В P. Lehmann, W. Osten, & AA. Goncalves (Ред.), Optical Measurement Systems for Industrial Inspection X (Том 10329). [103291B] (Proceedings of SPIE; Том 10329). SPIE International Optical Engineering. https://doi.org/10.1117/12.2269519
    Gritsevich, Maria ; Maconi, Goran ; Nolvi, Anton ; Kassamakov, Ivan ; Penttila, Antti ; Muinonen, Karri ; Haeggstrom, Edward. / Super-resolution Photonic Nanojet Interferometry: Photonic Nanojet Interaction with a Polymer Sample. Optical Measurement Systems for Industrial Inspection X. редактор / P Lehmann ; W Osten ; AA Goncalves. Том 10329 SPIE International Optical Engineering, 2017. (Proceedings of SPIE).
    @inproceedings{b132053dc4f84512aec27cabd17a5c5e,
    title = "Super-resolution Photonic Nanojet Interferometry: Photonic Nanojet Interaction with a Polymer Sample",
    keywords = "label-free imaging, super-resolution microscopy, LIGHT",
    author = "Maria Gritsevich and Goran Maconi and Anton Nolvi and Ivan Kassamakov and Antti Penttila and Karri Muinonen and Edward Haeggstrom",
    year = "2017",
    doi = "10.1117/12.2269519",
    language = "English",
    isbn = "978-1-5106-1103-0",
    volume = "10329",
    series = "Proceedings of SPIE",
    publisher = "SPIE International Optical Engineering",
    editor = "P Lehmann and W Osten and AA Goncalves",
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    }

    Gritsevich, M, Maconi, G, Nolvi, A, Kassamakov, I, Penttila, A, Muinonen, K & Haeggstrom, E 2017, Super-resolution Photonic Nanojet Interferometry: Photonic Nanojet Interaction with a Polymer Sample. в P Lehmann, W Osten & AA Goncalves (ред.), Optical Measurement Systems for Industrial Inspection X. том. 10329, 103291B, Proceedings of SPIE, том. 10329, SPIE International Optical Engineering, Conference on Optical Measurement Systems for Industrial Inspection X part of the SPIE Optical Metrology Symposium, Munich, Германия, 26/06/2017. https://doi.org/10.1117/12.2269519

    Super-resolution Photonic Nanojet Interferometry: Photonic Nanojet Interaction with a Polymer Sample. / Gritsevich, Maria; Maconi, Goran; Nolvi, Anton; Kassamakov, Ivan; Penttila, Antti; Muinonen, Karri; Haeggstrom, Edward.

    Optical Measurement Systems for Industrial Inspection X. ред. / P Lehmann; W Osten; AA Goncalves. Том 10329 SPIE International Optical Engineering, 2017. 103291B (Proceedings of SPIE; Том 10329).

    Результат исследований: Глава в книге, отчете, сборнике статейМатериалы конференцииНаучно-исследовательскаярецензирование

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    T1 - Super-resolution Photonic Nanojet Interferometry: Photonic Nanojet Interaction with a Polymer Sample

    AU - Gritsevich, Maria

    AU - Maconi, Goran

    AU - Nolvi, Anton

    AU - Kassamakov, Ivan

    AU - Penttila, Antti

    AU - Muinonen, Karri

    AU - Haeggstrom, Edward

    PY - 2017

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    KW - label-free imaging

    KW - super-resolution microscopy

    KW - LIGHT

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    U2 - 10.1117/12.2269519

    DO - 10.1117/12.2269519

    M3 - Conference contribution

    SN - 978-1-5106-1103-0

    VL - 10329

    T3 - Proceedings of SPIE

    BT - Optical Measurement Systems for Industrial Inspection X

    A2 - Lehmann, P

    A2 - Osten, W

    A2 - Goncalves, AA

    PB - SPIE International Optical Engineering

    ER -

    Gritsevich M, Maconi G, Nolvi A, Kassamakov I, Penttila A, Muinonen K и соавт. Super-resolution Photonic Nanojet Interferometry: Photonic Nanojet Interaction with a Polymer Sample. В Lehmann P, Osten W, Goncalves AA, редакторы, Optical Measurement Systems for Industrial Inspection X. Том 10329. SPIE International Optical Engineering. 2017. 103291B. (Proceedings of SPIE). https://doi.org/10.1117/12.2269519