ПРИМЕНЕНИЕ МЕТОДА ФАЗОВО-АМПЛИТУДНЫХ ФУНКЦИЙ В РЕНТГЕНОВСКОЙ И НЕЙТРОННОЙ РЕФЛЕКТОМЕТРИИ

科研成果: Article同行评审

摘要

The application of the method of phase-amplitude functions for calculating the X-ray or neutron reflectivity from planar nanostructures is considered. Several approximations and substitutions are described, which can be useful for different problems. It is shown that this method can be used to calculate reflection curves with lower computational costs than in other approaches. Comparison of model numerical calculations for various algorithms is presented. The Levenberg-Marquardt algorithm is used to solve the inverse problem and reconstruct the scattering potential of a metal film from the experimental reflection intensity. Experimental results are presented for two systems: Al2O3//Cr(200 Å) film and Al2O3//Cr(100 Å)/[Gd(50 Å)/Cr(11 Å)]6/Cr(100 Å) metal superlattice. The obtained scattering potentials allow us to draw conclusions about the layered structures of the samples and determine their dependence on growth conditions.
投稿的翻译标题APPLICATION OF THE METHOD OF PHASE-AMPLITUDE FUNCTIONSIN X-RAY AND NEUTRON REFLECTOMETRY
源语言Russian
页(从-至)3-12
页数10
期刊Поверхность. Рентгеновские, синхротронные и нейтронные исследования
5
DOI
Published - 2021

GRNTI

  • 29.00.00 PHYSICS

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  • VAK List

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